Kavli Affiliate: Marshall Bautz | Summary:The advent of back-illuminated complementary metal-oxide-semiconductor (CMOS) sensors and their well-known advantages over charge-coupled devices (CCDs) make them an attractive technology for future X-ray missions. However, numerous challenges remain, including improving their depletion depth and identifying effective methods to calculate per-pixel gain conversion. We have tested a commercial Sony IMX290LLR […]
Continue.. X-ray spectral performance of the Sony IMX290 CMOS sensor near Fano limit after a per-pixel gain calibration