Kavli Affiliate: Feng Wang | First 5 Authors: Jun-Yi Shan, Nathaniel Morrison, Su-Di Chen, Feng Wang, Eric Y. Ma | Summary: Microwave impedance microscopy (MIM) is an emerging scanning probe technique for nanoscale complex permittivity mapping and has made significant impacts in diverse fields from semiconductors to quantum materials. To date, the most significant hurdles […]
Continue.. Johnson-noise-limited cancellation-free microwave impedance microscopy with monolithic silicon cantilever probes