Kavli Affiliate: Eric D. Miller | First 5 Authors: Benjamin Schneider, Gregory Prigozhin, Richard F. Foster, Marshall W. Bautz, Hope Fu | Summary: The advent of back-illuminated complementary metal-oxide-semiconductor (CMOS) sensors and their well-known advantages over charge-coupled devices (CCDs) make them an attractive technology for future X-ray missions. However, numerous challenges remain, including improving their […]
Continue.. X-ray spectral performance of the Sony IMX290 CMOS sensor near Fano limit after a per-pixel gain calibration