Kavli Affiliate: David A. Muller | First 5 Authors: Desheng Ma, Steven E. Zeltmann, Chenyu Zhang, Zhaslan Baraissov, Yu-Tsun Shao | Summary: Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration corrector to produce a sub-{AA}ngstr"om probe is a complex and time-costly […]
Continue.. Emittance Minimization for Aberration Correction II: Physics-informed Bayesian Optimization of an Electron Microscope