Kavli Affiliate: David A. Muller | First 5 Authors: Desheng Ma, Steven E. Zeltmann, Chenyu Zhang, Zhaslan Baraissov, Yu-Tsun Shao | Summary: Precise alignment of the electron beam is critical for successful application of scanning transmission electron microscopes (STEM) to understanding materials at atomic level. Despite the success of aberration correctors, aberration correction is still […]
Continue.. Emittance Minimization for Aberration Correction I: Aberration correction of an electron microscope without knowing the aberration coefficients