Harish-Chandra’s admissibility theorem and beyond

Kavli Affiliate: Toshiyuki Kobayashi | First 5 Authors: Toshiyuki Kobayashi, , , , | Summary: This article is a record of the lecture at the centennial conference for Harish-Chandra. The admissibility theorem of Harish-Chandra concerns the restrictions of irreducible representations to maximal compact subgroups. In this article, we begin with a brief explanation of two […]


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Natural Language Fine-Tuning

Kavli Affiliate: Jia Liu | First 5 Authors: Jia Liu, Yue Wang, Zhiqi Lin, Min Chen, Yixue Hao | Summary: Large language model fine-tuning techniques typically depend on extensive labeled data, external guidance, and feedback, such as human alignment, scalar rewards, and demonstration. However, in practical application, the scarcity of specific knowledge poses unprecedented challenges […]


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Emittance Minimization for Aberration Correction I: Aberration correction of an electron microscope without knowing the aberration coefficients

Kavli Affiliate: David A. Muller | First 5 Authors: Desheng Ma, Steven E. Zeltmann, Chenyu Zhang, Zhaslan Baraissov, Yu-Tsun Shao | Summary: Precise alignment of the electron beam is critical for successful application of scanning transmission electron microscopes (STEM) to understanding materials at atomic level. Despite the success of aberration correctors, aberration correction is still […]


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Emittance Minimization for Aberration Correction II: Physics-informed Bayesian Optimization of an Electron Microscope

Kavli Affiliate: David A. Muller | First 5 Authors: Desheng Ma, Steven E. Zeltmann, Chenyu Zhang, Zhaslan Baraissov, Yu-Tsun Shao | Summary: Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration corrector to produce a sub-{AA}ngstr"om probe is a complex and time-costly […]


Continue.. Emittance Minimization for Aberration Correction II: Physics-informed Bayesian Optimization of an Electron Microscope