Kavli Affiliate: Giordano Scappucci | First 5 Authors: Marc Botifoll, Ivan Pinto-Huguet, Enzo Rotunno, Thomas Galvani, Catalina Coll | Summary: (Scanning) transmission electron microscopy ((S)TEM) has significantly advanced materials science but faces challenges in correlating precise atomic structure information with the functional properties of devices due to its time-intensive nature. To address this, we introduce […]
Continue.. Artificial Intelligence-Assisted Workflow for Transmission Electron Microscopy: From Data Analysis Automation to Materials Knowledge Unveiling