Kavli Affiliate: Darrell G. Schlom
| First 5 Authors: G. M. Ferguson, Hari P. Nair, Nathaniel J. Schreiber, Ludi Miao, Kyle M. Shen
| Summary:
We conduct local magnetic measurements on superconducting thin-film samples
of Sr$mathrm{_2}$RuO$mathrm{_4}$ using scanning Superconducting Quantum
Interference Device (SQUID) susceptometry. From the diamagnetic response, we
extract the magnetic penetration depth, $lambda$, which exhibits a quadratic
temperature dependence at low temperatures. Although a quadratic dependence in
high-purity bulk samples has been attributed to non-local electrodynamics, our
analysis suggests that in our thin-film samples the presence of scattering is
the origin of the quadratic dependence. While we observe micron-scale
variations in the diamagnetic response and superconducting transition
temperature, the form of the temperature dependence of $lambda$ is independent
of position. Finally, we characterize flux trapping in superconducting rings
lithographically fabricated from the thin films, paving the way to systematic
device-based tests of the superconducting order parameter in
Sr$mathrm{_2}$RuO$mathrm{_4}$.
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