Kavli Affiliate: Brian Lantz
| First 5 Authors: Sina M Koehlenbeck, Lance Lee, Mario D Balcazar, Ying Chen, Vincent Esposito
| Summary:
The past decades have witnessed the development of new X-ray beam sources
with brightness growing at a rate surpassing Moore’s law. Current and upcoming
diffraction limited and fully coherent X-ray beam sources, including multi-bend
achromat based synchrotron sources and high repetition rate X-ray free electron
lasers, puts increasingly stringent requirements on stability and accuracy of
X-ray optics systems. Parasitic motion errors at sub-micro radian scale in beam
transport and beam conditioning optics can lead to significant loss of
coherence and brightness delivered from source to experiment. To address this
challenge, we incorporated optical metrology based on interferometry and
differential wavefront sensing as part of the X-ray optics motion control
system. A prototype X-ray optics system was constructed following the optical
layout of a tunable X-ray cavity. On-line interferometric metrology enabled
dynamical feedback to a motion control system to track and compensate for
motion errors. The system achieved sub-microradian scale performance, as
multiple optical elements are synchronously and continuously adjusted. This
first proof of principle measurement demonstrated both the potential and
necessity of incorporating optical metrology as part of the motion control
architecture for large scale X-ray optical systems such as monochromators,
delay lines, and in particular, X-ray cavity systems to enable the next
generation cavity-based X-ray free electron lasers.
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