Kavli Affiliate: Xiang Zhang
| First 5 Authors: Xiang Zhang, Xiang Zhang, , ,
| Summary:
Interferometric scattering microscopy was widely applied in nanoscopic
detection and tracking due to its high sensitivity and label-free manner. The
sensitivity is limited by contrast. Oblique illumination provided high contrast
with lower power density. However, no model has been established to illustrate
the schematic and complex rotation setup was needed. Here, we established a
model of contrast and the unexpected reflections both in intensity and phase
modulation. Then, the contrast enhancement was verified in oblique
illumination. To provide a uniform contrast measurement, the phase map of
oblique illumination was calibrated through scanning without the need for
rotation. Our work gives new insights in oblique illumination and may inspire
new idea to enhance contrast with phase and intensity modulation.
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