Kavli Affiliate: Kerry Vahala
| First 5 Authors: Heming Wang, Lue Wu, Zhiquan Yuan, Kerry Vahala,
| Summary:
Narrow-linewidth lasers are important to many applications spanning precision
metrology to sensing systems. Their miniaturization in the form of on-chip
lasers is receiving increasing attention. Here, a noise level that is
consistent with a fundamental frequency noise of 9 mHz$cdot$Hz/Hz linewidth
(60 mHz linewidth) is measured in a Brillouin laser. The results leverage
ultra-high-Q silica-on-silicon resonators and point towards a new performance
target for chip-based laser platforms.
| Search Query: ArXiv Query: search_query=au:”Kerry Vahala”&id_list=&start=0&max_results=10