Kavli Affiliate: Noah A. Kurinsky
| First 5 Authors: Riley J. Carpenter, Jadyn Anczarski, Ivar Rydstrom, Aviv Simchony, Zoe J. Smith
| Summary:
Predictable circuit response is a critical prerequisite for accurate
electronic measurements. We describe a powerful, yet straightforward,
experimental method and analysis model that utilizes an affordable LCR meter in
conjunction with an in situ parasitic impedance background correction procedure
to measure the temperature-dependent impedance (magnitude and phase) of
individual passive circuit elements mounted in a cryostat. We show how the
model unambiguously identified a 20x drop in capacitance for 22 microF 5XR
multilayer ceramic capacitors cooled from 300 K to 360 mK in an environment
with parasitic capacitance of order 300 pF. The same experimental procedure,
based on a simple two-wire measurement, was also used to successfully measure
10 pF and 22 pF thin-film capacitors and 100 MOhm thick-film resistors. The
results showed that the resistor values increased by up to an order of
magnitude when the devices were cooled from 300 K to 360 mK. Most importantly,
the simple data acquisition method and robust analysis model were shown to
effectively extend the accuracy of a simple benchtop LCR meter beyond its
manufacturer-guaranteed values for a wide range of measurement frequencies.
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