Characterization of X-ray Detectors in the MIT X-ray Polarimetry Beamline

Kavli Affiliate: Herman L. Marshall

| First 5 Authors: Sarah N. T. Heine, Herman L. Marshall, Benjamin Schneider, Beverly Lamar, Nithya Kothnur

| Summary:

The MIT X-ray Polarimetry Beamline is a facility that we developed for
testing components for possible use in X-ray polarimetry. Over the past few
years, we have demonstrated that the X-ray source can generate nearly 100%
polarized X-rays at various energies from 183 eV (Boron K$alpha$) to 705 eV
(Fe L$alpha$) using a laterally graded multilayer coated mirror (LGML)
oriented at 45deg to the source. The position angle of the polarization can
be rotated through a range of roughly 150deg. In a downstream chamber, we can
orient a Princeton Instruments MTE1300B CCD camera to observe the polarized
light either directly or after reflection at 45deg by a second LGML. In
support of the REDSoX Polarimeter project, we have tested four other detectors
by directly comparing them to the PI camera. Two were CCD cameras: a Raptor
Eagle XV and a CCID94 produced by MIT Lincoln Laboratories, and two had sCMOS
sensors: the Sydor Wraith with a GSENSE 400BSI sensor and a custom Sony IMX290
sensor. We will show results comparing quantum efficiencies and event images in
the soft X-ray band.

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