Kavli Affiliate: Hu Zhan
| First 5 Authors: Zun Luo, Wei Du, Baocun Chen, Xianmin Meng, Hu Zhan
| Summary:
Precision measurements in astronomy require stringent control of systematics
such as those arising from imperfect correction of sensor effects. In this
work, we develop a parametric method to model the wavelength dependence of
pixel response non-uniformity (PRNU) for a laser-annealed backside-illuminated
charge-coupled device. The model accurately reproduces the PRNU patterns of
flat-field images taken at nine wavelengths from 290nm to 950nm, leaving the
root mean square (RMS) residuals no more than 0.2% in most cases. By removing
the large-scale non-uniformity in the flat fields, the RMS residuals are
further reduced. This model fitting approach gives more accurate predictions of
the PRNU than cubic-spline interpolation does with fewer free parameters. It
can be applied to make PRNU corrections for individual objects according to
their spectral energy distribution to reduce the photometry errors caused by
the wavelength-dependent PRNU, if sub-percent level precision is required.
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