Kavli Affiliate: Tadayuki Takahashi
| First 5 Authors: Tenyo Kawamura, Tadashi Orita, Shin’ichiro Takeda, Shin Watanabe, Hirokazu Ikeda
| Summary:
We present our latest ASIC, which is used for the readout of Cadmium
Telluride double-sided strip detectors (CdTe DSDs) and high spectroscopic
imaging. It is implemented in a 0.35 um CMOS technology (X-Fab XH035), consists
of 64 readout channels, and has a function that performs simultaneous AD
conversion for each channel. The equivalent noise charge of 54.9 e- +/- 11.3 e-
(rms) is measured without connecting the ASIC to any detectors. From the
spectroscopy measurements using a CdTe single-sided strip detector, the energy
resolution of 1.12 keV (FWHM) is obtained at 13.9 keV, and photons within the
energy from 6.4 keV to 122.1 keV are detected. Based on the experimental
results, we propose a new low-noise readout architecture making use of a
slew-rate limited mode at the shaper followed by a peak detector circuit.
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