Imaging and spectral performance of CdTe double-sided strip detectors for the Hard X-ray Imager onboard ASTRO-H

Kavli Affiliate: Shinichiro Takeda

| First 5 Authors: Kouichi Hagino, Hirokazu Odaka, Goro Sato, Shin Watanabe, Shin’ichiro Takeda

| Summary:

The imaging and spectral performance of CdTe double-sided strip detectors
(CdTe-DSDs) was evaluated for the ASTRO-H mission. The charcterized CdTe-DSDs
have a strip pitch of 0.25 mm, an imaging area of 3.2 cm$times$3.2 cm and a
thickness of 0.75 mm. The detector was successfully operated at a temperature
of $-20^circ$C and with an applied bias voltage of 250 V. By using two-strip
events as well as one-strip events for the event reconstruction, a good energy
resolution of 2.0 keV at 59.5 keV and a sub-strip spatial resolution was
achieved. The hard X-ray and gamma-ray response of CdTe-DSDs is complex due to
the properties of CdTe and the small pixel effect. Therefore, one of the issues
to investigate is the response of the CdTe-DSD. In order to investigate the
spatial dependence of the detector response, we performed fine beam scan
experiments at SPring-8, a synchrotron radiation facility. From these
experiments, the depth structure of the electric field was determined as well
as properties of carriers in the detector and successfully reproduced the
experimental data with simulated spectra.

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